jesd22-a108pdf

JEDECJESD22-A108.3*77.Passed.HighlyAcceleratedStressTest.(HAST)*.JEDECJESD22-A110.3*77.Passed.Autoclave*.JEDECJESD22-A102.3*77.Passed.,JESD22Series,ReliabilityTestMethodsforPackagedDevices.JESD46,GuidelinesforUserNotificationofProduct/processChangesbySemiconductorSuppliers.,Part#:JESD22-A108.Download.FileSize:34Kbytes.Page:2Pages.Description:RichtekTechnologyCorporation.Manufacturer:RichtekTec...

參考資訊如下
High Temperature Operating Life (HTOL)* JEDEC JESD22 ...

JEDEC JESD22-A108. 3*77. Passed. Highly Accelerated Stress Test. (HAST)*. JEDEC JESD22-A110. 3*77. Passed. Autoclave*. JEDEC JESD22-A102. 3*77. Passed.

JEDEC STANDARD

JESD22 Series, Reliability Test Methods for Packaged Devices. JESD46, Guidelines for User Notification of Product/process Changes by Semiconductor Suppliers.

JESD22-A108 Datasheet(PDF)

Part #: JESD22-A108. Download. File Size: 34Kbytes. Page: 2 Pages. Description: Richtek Technology Corporation. Manufacturer: Richtek Technology ...

Temperature, Bias, and Operating Life JESD22

These tables briefly describe most of the differences between the text of this standard, JESD22-. A108E, and its predecessors JESD22-A108D (November 2010), ...

Temperature, Bias, and Operating Life JESD22

JESD22-A108C. (Revision of JESD22-A108-B). JUNE 2005. JEDEC SOLID STATE TECHNOLOGY ASSOCIATION. Page 2. NOTICE. JEDEC standards and publications contain ...

Temperature, Bias, and Operating Life JESD22

This table briefly describes the changes made to JESD22-A108C, compared to its predecessor,. JESD22-A108-B (December 2000). Page. Term and description of change.

技术文档

JESD22-A104C, pdf, 114.58KB ; JESD22-A105C(QC-28), pdf, 48.71KB ; JESD22-A106B(QC-29), pdf, 186.14KB ; JESD22-A108, pdf, 36.21KB ...